The testing process for Silicon Photonics chips includes measurements of optical performance, beam analysis, and detection of optical fiber connectivity, among other aspects. A comprehensive opto-electric automated test platform purpose-built to accelerate high-volume silicon photonics and co-packaged optics manufacturing. By integrating industry-leading optical and electrical instrumentation with Teradyne's proven UltraFLEXplus platform, the Teradyne Photon 100 enables. Photonic integrated circuits (PICs) are a key enabler driving advances in communications, optical computing, aerospace, defense and medical applications. EXFO delivers a complete, flexible and repeatable approach to testing PIC and optical components. By combining OPAL automated test stations, high‑performance optical testers and the EXFO Pilot automation. First Silicon Photonics High Speed (up to 67GHz) 34thSWTest Conference | Carlsbad, CA, June 2 –4, 2025 First Silicon Photonics High Speed (up to 67GHz) Wafer Probe Card Demonstration for S-Parameter Testing on the Production Wafer Hsu Hao (Andy) Chang –Marvell Amit Agnihotri –Marvell Don Lee. Silicon Photonics - Efficient Wafer Level Test and services for design, test and analytics.